M-Series 4-Inch Simple Manual Probe Station
产品概要
A simple type based on the university education and laboratory test wafer prober, this equipment is mainly applied in the semiconductor industry, as well as test of the photoelectric industry, including research and development of precision electrical measurement of complex high-speed device, the chip and LD/LED/PD tests, PCB/packaging device testing, rf testing 50 microns electrode/PAD test materials/components/CV IV characteristic test, etc.
基本信息
| 产品型号 | M4 | 工作环境 | Open type |
| 电力需求 | 220V,50~60Hz | 操控方式 | Manual probe station |
| 产品尺寸 | 400mm long *400mm wide *550mm high | 设备重量 | About 30 kg |
应用方向
This equipment is mainly used for testing in semiconductor and optoelectronic industries, including r&d chip and LD/LED/PD test of complex high-speed devices,PCB/ package device test, AND IV/CV characteristic test of electrode /PAD test material/device over 50 microns.
